Optimal Clustering and Statistical Identification of Defective ICs using IDDQ Testing
نویسندگان
چکیده
Instead of relying on setting an arbitrary threshold current value as in traditional IDDQ testing, clustering based test technique relies on the characteristics of an IC with respect to all the other ICs in a lot to make a test decision. An improvement in the cluster analysis technique for IDDQ testing is presented. Results of applying this technique to data collected on a high volume graphics chip are presented. The results are also compared against a newer more innovative form of IDDQ testing.
منابع مشابه
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تاریخ انتشار 2000